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Daniel S. Gianola
Group Page: http://gianola.seas.upenn.edu |
Ph.D., Mechanical Engineering, Johns Hopkins University, 2007
M.S., Mechanical Engineering, Johns Hopkins University, 2005
B.S., Engineering Mechanics, University of Wisconsin-Madison, 2002
Research Interests
Dr. Gianola’s interests lie in the area of nanomechanics, with a focus on understanding, modeling and predicting the mechanical response of advanced materials at reduced length scales. His experimental studies use new methodologies for the quantitative mechanical testing of materials at the nanoscale and state-of-the-art electron microscopy techniques to observe the processes that govern their behavior.
Select Publications
- G. Richter, K. Hillerich, D.S. Gianola, R. Monig, O. Kraft, C.A. Volkert, “Ultrahigh strength nanowhiskers prepared by physical vapor deposition,” Nano Letters (2009), in press.
- D.S. Gianola, C. Eberl, “Micro- and nanoscale tensile testing of materials,” JOM 61 (2009), 24-35 (invited review).
- D.S. Gianola, C. Eberl, X.M. Cheng, K.J. Hemker, “Stress-driven surface topography evolution in nanocrystalline Al thin films,” Advanced Materials 20 (2008), 303-308.
- M. Legros, D.S. Gianola, K.J. Hemker, “In situ TEM observations of fast grain boundary motion in stressed nanocrystalline aluminum films,” Acta Materialia 56 (2008), 3380-3393.
- D.S. Gianola, S. Van Petegem, M. Legros, S. Brandstetter, H. Van Swygenhoven, K.J. Hemker, “Stress assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films,” Acta Materialia 54 (2006), 2253-2263.
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