Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy

	Focused Ion Beam

	Atomic Force Microscopy
	• DI Dimension 3000 AFM • DI Multimode AFM

	Ion Scattering

	Applications

	Reservations

	Instrument Rates

	PRNF Registration Form

DI Dimension 3000 AFM

The Digital Instruments Dimension 3000 scanning probe microscope (SPM) is an extremely versatile proximal probe dedicated to nanometer-scale imaging and physical measurements of material surfaces. Materials of interest cover a full range from metals, insulators, ceramics, polymers, and biological samples with minimal sample preparation. The Dimension 3000 SPM at Penn is capable of a wide range of data collection techniques including contact mode, tapping mode, and phase imaging. The Dimension 3000 is capable of atomic-scale resolution (in ideal systems). It can accept samples up to 8 inches in diameter and can function in ambient conditions or under the surface of liquids. The versatility of this instrument makes it a valuable tool in the fields of chemistry, biology, engineering, nano-technology, and medicine.

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718