Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy

	Focused Ion Beam

	Atomic Force Microscopy
	• DI Dimension 3000 AFM • DI Multimode AFM

	Ion Scattering

	Applications

	Reservations

	Instrument Rates

DI Dimension 3000 AFM

The Digital Instruments Dimension 3000 scanning probe microscope (SPM) is an extremely versatile proximal probe dedicated to nanometer-scale imaging and physical measurements of material surfaces. Materials of interest cover a full range from metals, insulators, ceramics, polymers, and biological samples with minimal sample preparation. The Dimension 3000 SPM at Penn is capable of a wide range of data collection techniques including contact mode, tapping mode, and phase imaging. The Dimension 3000 is capable of atomic-scale resolution (in ideal systems). It can accept samples up to 8 inches in diameter and can function in ambient conditions or under the surface of liquids. The versatility of this instrument makes it a valuable tool in the fields of chemistry, biology, engineering, nano-technology, and medicine.

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718