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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
  • DI Dimension 3000 AFM

DI Multimode AFM
Ion Scattering
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Instrument Rates
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NCF Registration Form


DI Dimension 3000 AFM
The Digital Instruments Dimension 3000 scanning probe microscope (SPM) is an extremely versatile proximal probe dedicated to nanometer-scale imaging and physical measurements of material surfaces. Materials of interest cover a full range from metals, insulators, ceramics, polymers, and biological samples with minimal sample preparation. The Dimension 3000 SPM at Penn is capable of a wide range of data collection techniques including contact mode, tapping mode, and phase imaging. The Dimension 3000 is capable of atomic-scale resolution (in ideal systems). It can accept samples up to 8 inches in diameter and can function in ambient conditions or under the surface of liquids. The versatility of this instrument makes it a valuable tool in the fields of chemistry, biology, engineering, nano-technology, and medicine.


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
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  Penn Engineering