General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
• DI Dimension 3000 AFM
•
DI Multimode AFM
Ion Scattering
Applications
Reservations
Instrument Rates
DI Dimension 3000 AFM
Applications
Tapping Mode AFM
Contact Mode AFM
Phase Contrast AFM
Phase Sensitive AFM
Fluid Tapping AFM
Lift Mode/Interleave
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM)
Scanning Conductance Microscopy (SCM)
Scanning Surface Potential Microscopy (SSPM)
Scanning Impedance Microscopy (SIM)
Scanning Gate Microscopy (SGM)
Piezo Force Microscopy (PFM)
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 /
prnf@seas.upenn.edu
/ 215.898.8718