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Penn Regional Nanotechnology Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
  • DI Dimension 3000 AFM

DI Multimode AFM
Ion Scattering
Applications
Reservations
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Instrument Rates
   

 

DI Dimension 3000 AFM
 
Applications
 
Tapping Mode AFM
Contact Mode AFM
Phase Contrast AFM
Phase Sensitive AFM
Fluid Tapping AFM
Lift Mode/Interleave
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM)
Scanning Conductance Microscopy (SCM)
Scanning Surface Potential Microscopy (SSPM)
Scanning Impedance Microscopy (SIM)
Scanning Gate Microscopy (SGM)
Piezo Force Microscopy (PFM)

 

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering