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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
  • DI Dimension 3000 AFM

• DI Multimode AFM
Ion Scattering
Applications
Reservations
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Instrument Rates
   

 

DI Dimension 3000 AFM
 
Specifications
 
AFM Modes  
  Contact Mode
  Non-contact Mode
  Tapping Mode
  Tapping Mode Fluid Cell
  Lateral Force
  Phase Sensitive
  Lift Mode/Interleave
  Magnetic Force
  Electrical Force
  Surface Potential Force modulation (require special tip holder and tips)
   
Sample Size  
  Up to 20cm diameter 12mm thickness
   
Scanner ranges  
  X-Y imaging area approx. 80µm x 80µm, Z range approx. 6µm.
   
Vibration Isolation  
  Pneumatic table
   
Number of Channels  
  5
   
Modules  
  Extender Module
  Signal Access Module

 
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718		 lower right curve 1
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  Penn Engineering