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DI
Multimode AFM |
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| The Digital Instruments
Multimode is the highest resolution, commercially available
scanning probe microscope
(SPM). It is designed for atomic-scale resolution imaging of
material surfaces. A compact and rigid design give the Multimode
the mechanical and thermal stability required for atomic-scale
resolution. Materials of interest cover a full range from metals,
insulators, ceramics, polymers, and biological samples. Sample
preparation is minimal; however, sample size is limited to approximately
1 square centimeter and samples must be low profile. The Multimode
is a dual function instrument with atomic force microscope (AFM)
and scanning tunneling microscope (STM) capabilities. The Multimode
at Penn is capable of both contact mode and tapping mode AFM,
as well as phase imaging. STM modes include height and constant
current imaging. This instrument
is the choice of scientists and engineers studying surfaces at
the highest lateral resolution available.
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