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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
  • DI Dimension 3000 AFM

DI Multimode AFM
Ion Scattering
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Instrument Rates
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NCF Registration Form


DI Multimode AFM
The Digital Instruments Multimode is the highest resolution, commercially available scanning probe microscope (SPM). It is designed for atomic-scale resolution imaging of material surfaces. A compact and rigid design give the Multimode the mechanical and thermal stability required for atomic-scale resolution. Materials of interest cover a full range from metals, insulators, ceramics, polymers, and biological samples. Sample preparation is minimal; however, sample size is limited to approximately 1 square centimeter and samples must be low profile. The Multimode is a dual function instrument with atomic force microscope (AFM) and scanning tunneling microscope (STM) capabilities. The Multimode at Penn is capable of both contact mode and tapping mode AFM, as well as phase imaging. STM modes include height and constant current imaging. This instrument is the choice of scientists and engineers studying surfaces at the highest lateral resolution available.


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
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  Penn Engineering