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Surface Studies - Atomic
Force Microscopy |
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Electrical
Property Measurement using AFM |
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| This is an example
of AFM imaging differences in electrical properties in a material.
A patterned surface of a conductive polymer was imaged using
two different SPM modes (image dimension 40mm x 40mm). Before
imaging, on and off states were written using the AFM. The
right image is a SSPM image showing localization of charge.
Dark areas are more negative than light areas. The left image
is a SCM image showing the corresponding change in conductivity
of the film. Green areas are more metallic than blue. |
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