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Electron Microscopy
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Surface Studies - Atomic Force Microscopy
 
Electrical Property Measurement using AFM
 
This is an example of AFM imaging differences in electrical properties in a material. A patterned surface of a conductive polymer was imaged using two different SPM modes (image dimension 40mm x 40mm). Before imaging, on and off states were written using the AFM. The right image is a SSPM image showing localization of charge. Dark areas are more negative than light areas. The left image is a SCM image showing the corresponding change in conductivity of the film. Green areas are more metallic than blue.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
lower right curve 1
lower right curve 2

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