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Nanoscale Characterization Facility Penn Engineering
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Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

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Surface Studies - Atomic Force Microscopy
Electrical Property Measurement using AFM
This is an example of AFM imaging differences in electrical properties in a material. A patterned surface of a conductive polymer was imaged using two different SPM modes (image dimension 40mm x 40mm). Before imaging, on and off states were written using the AFM. The right image is a SSPM image showing localization of charge. Dark areas are more negative than light areas. The left image is a SCM image showing the corresponding change in conductivity of the film. Green areas are more metallic than blue.


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
lower right curve 1
lower right curve 2

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