PRN logo banner 2
Nanoscale Characterization Facility Penn Engineering
banner right
PRN logo
General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
Reservations
dsgasdg fgijg
Instrument Rates
b a
NCF Registration Form
   

 

 
Surface Studies - Atomic Force Microscopy
 
Circuit fabrication using AFM manipulation.

The experiment begins with one vertical tube (main tube) and one horizontal tube (lasso tube) (a). A tube is then brought in close proximity to the main tube (b) and the tube is pushed against (perhaps on top of) the main tube (c). Additional tubes are then manipulated on top of the main tube (d). Finally, the lasso tube is opened and unwanted tubes are pushed away (e). Image (f) shows some unraveling of the nanotubes that has occurred as a result of the AFM manipulation.

J. Lefebvre, J. F. Lynch, M. Llaguno, M. Radosavljevic and A. T. Johnson, Single-wall carbon nanotube circuits assembled with an atomic force microscope, Appl. Phys. Lett. 75, 3014-3016(1999).

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
lower right curve 1
lower right curve 2

  Penn Engineering