Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy

	Focused Ion Beam

	Atomic Force Microscopy

	Ion Scattering

	Applications
	• General Morphology • Structural Studies • Compositional Analysis • Surface Studies • Nanofabrication

	Reservations

	Instrument Rates

	PRNF Registration Form

Surface Studies - Atomic Force Microscopy

AFM Imaging of Carbon Nanotubes

This is a tapping mode AFM image of a bundle of carbon nanotubes collected using the Digital Instruments Multimode AFM. Courtesy of Marko Radosavljevic, Dept. of Physics, University of Pennsylvania.

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718