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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
Reservations
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Instrument Rates
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NCF Registration Form
   

 

 
General Morphology
 
Low kV SEM Imaging of Collagen
 
This image was collected with our 6300FV SEM at 1 kV from an uncoated sample of collagen. Scanning Electron Microscopes, like the 6300FV, which are mounted with a field emission gun dramatically increase the productivity of our facility by allowing for the low kV imaging of uncoated, beam sensitive samples.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering