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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
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Compositional Analysis
 
Energy Filtered TEM
 

These images were collected using the Gatan Image Filter on the JEOL 2010F TEM/STEM from a BN sample dispersed on a holey carbon film. The electron energy loss spectrum shows families of peaks for B, C, and N in order of increasing energy loss (upper left). The images at the upper right and lower left are EFTEM maps for B and C, respectively. The image on the lower right represents a combined map for B (blue) and C (yellow).

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
lower right curve 1
lower right curve 2

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