In addition to EFTEM
imaging, the Gatan Image Filter on the JEOL 2010F TEM/STEM
can be configured to collect a series of image slices through
the electron energy loss spectrum. The upper images show
a spectrum and TEM image of BN grains on a carbon film.
The lower image shows an animated view of the energy slices
collected from 150 eV to 420 eV in 10 eV increments. As
the animation runs, the BN grains get brighter at ~180
eV and ~400 eV as the energy slices intersect the B and
N edges, respectively. At an energy of ~280 eV, the carbon
film gets brighter due to the C edge in the EELS spectrum.