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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
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Compositional Analysis
 
Energy Filtered TEM Spectrum Image
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In addition to EFTEM imaging, the Gatan Image Filter on the JEOL 2010F TEM/STEM can be configured to collect a series of image slices through the electron energy loss spectrum. The upper images show a spectrum and TEM image of BN grains on a carbon film. The lower image shows an animated view of the energy slices collected from 150 eV to 420 eV in 10 eV increments. As the animation runs, the BN grains get brighter at ~180 eV and ~400 eV as the energy slices intersect the B and N edges, respectively. At an energy of ~280 eV, the carbon film gets brighter due to the C edge in the EELS spectrum.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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