General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
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General Morphology
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Structural Studies
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Compositional Analysis
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Surface Studies
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Nanofabrication
Reservations
Instrument Rates
General Morphology
SEM Imaging of Oriented Polymer Fibers
This image was collected with our 6300FV SEM at 1 kV from a carbon coated sample of oriented polymer fibers.
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 /
prnf@seas.upenn.edu
/ 215.898.8718