General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
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General Morphology
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Structural Studies
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Compositional Analysis
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Surface Studies
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Nanofabrication
Reservations
Instrument Rates
Surface Studies
Ion Beam Analysis
RBS analysis of a PZT Film
Detection of a 20A CeO Film through RBS
PMMA-grafted gold particles
Diffusion of metal nanoparticles in polymer
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 /
prnf@seas.upenn.edu
/ 215.898.8718