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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
Reservations
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Instrument Rates
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NCF Registration Form
   

 

 
Surface Studies - Atomic Force Microscopy
 
MFM Image of a Computer Harddisk
 
Topography of 750MB disk acquired in Tapping Mode(left). Frequency contrast image acquired in Interleave Mode (right). We were able to calculate the storage capacity of this disk from the MFM image. Please note that MFM image is unaffected by topography. Courtesy of Tony Alvarez

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering