Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy

	Focused Ion Beam

	Atomic Force Microscopy

	Ion Scattering

	Applications
	• General Morphology • Structural Studies • Compositional Analysis • Surface Studies • Nanofabrication

	Reservations

	Instrument Rates

	PRNF Registration Form

Surface Studies - Atomic Force Microscopy

MFM Image of a Computer Harddisk

Topography of 750MB disk acquired in Tapping Mode(left). Frequency contrast image acquired in Interleave Mode (right). We were able to calculate the storage capacity of this disk from the MFM image. Please note that MFM image is unaffected by topography. Courtesy of Tony Alvarez

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718