PRN logo banner 2
Nanoscale Characterization Facility Penn Engineering
banner right
PRN logo
General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

dsgasdg fgijg
Instrument Rates
b a
NCF Registration Form


Surface Studies - Atomic Force Microscopy
MFM Image of a Computer Harddisk
Topography of 750MB disk acquired in Tapping Mode(left). Frequency contrast image acquired in Interleave Mode (right). We were able to calculate the storage capacity of this disk from the MFM image. Please note that MFM image is unaffected by topography. Courtesy of Tony Alvarez


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
lower right curve 1
lower right curve 2

  Penn Engineering