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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

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Instrument Rates
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Compositional Analysis
X-ray Mapping of a Paint Chip

These images were collected using the JEOL 6300F HRSEM and the PGT IMIX EDS workstation. The sample is a paint chip that was sectioned normal to the successive layers of paint. The maps clearly show the compositional heterogeneity of the sample. The results of the study revealed the transition from lead-based paint to a paint rich in titanium, calcium and silicon.


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
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  Penn Engineering