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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  • General Morphology

• Structural Studies

• Compositional Analysis

• Surface Studies

• Nanofabrication
Reservations
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Instrument Rates
   

 

 
Compositional Analysis
 
Dark-Field STEM Imaging of Pd Nanoparticles on a Zeolite
 

High-angle annular Dark field imaging in STEM mode on the JEOL 2010F TEM/STEM is one of the most powerful techniques for the characterization of metalic nanoparticles on catalyst particles. The Pd particles in this image range from 2 to 10 nm.

 
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718		 lower right curve 1
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  Penn Engineering