Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy

	Focused Ion Beam

	Atomic Force Microscopy

	Ion Scattering

	Applications
	• General Morphology • Structural Studies • Compositional Analysis • Surface Studies • Nanofabrication

	Reservations

	Instrument Rates

	PRNF Registration Form

Surface Studies - Atomic Force Microscopy

Phase Imaging of a Coated Fiber

Topography (left) and Phase Image (right) of a coated fiber. Note that the phase image demonstrates the presence of the diffusion of a foreign material. This foreign material does not show up in topography. Courtesy Tony Alvarez and Anthony Ribaudo of Honeywell.

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718