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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

Nanofabrication
Reservations
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Instrument Rates
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Surface Studies - Atomic Force Microscopy
 
Phase Imaging of a Coated Fiber
 
 
Topography (left) and Phase Image (right) of a coated fiber. Note that the phase image demonstrates the presence of the diffusion of a foreign material. This foreign material does not show up in topography. Courtesy Tony Alvarez and Anthony Ribaudo of Honeywell.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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