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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
  General Morphology

Structural Studies

Compositional Analysis

Surface Studies

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Instrument Rates
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NCF Registration Form


Surface Studies
Atomic Force Microscopy
Nanotube Imaging
Magnetic Force Microscopy of a Harddisk
Scanning Surface Potential Image of SrTiO3
Scanning Surface Potential Image of ZnO
Phase Imaging Microscopy
Tapping mode AFM in Fluid Cell
Electrical Property Measurements using AFM


Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / / 215.898.8718
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  Penn Engineering