General Information
Electron Microscopy
• JEOL 2010F FEG
HRTEM/STEM
• JEOL 2010 TEM
• JEOL 7500F FEG HRSEM
• FEI Quanta FEG ESEM
Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
Instrument Rates
PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 /
prnf@seas.upenn.edu
/ 215.898.8718