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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
 

• JEOL 2010F FEG
   HRTEM/STEM


• JEOL 2100 TEM

• JEOL 7500F FEG HRSEM

• FEI Quanta FEG ESEM

Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
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Instrument Rates
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NCF Registration Form
   

 

FEI 600 Quanta FEG ESEM
 

The Quanta 600 FEG Mark II scanning electron microscope (SEM) is equipped with a unique array of accessories to enable the combination of high-resolution imaging and nanoscale manipulation allowing for powerful in situ experiments involving controlled stimuli and correlated response. In situ capabilities include: nanoscale manipulation of specimen or probe, access to the large sample volume by fluids, gases, electrical, optical and mechanical probes; detection of sample response to such probes, including the electron beam itself; and the temperature dependences of all these phenomena.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering