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Penn Regional Nanotechnology Facility Penn Engineering
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General Information
Electron Microscopy
 

• JEOL 2010F FEG
   HRTEM/STEM


• JEOL 2010 TEM

• JEOL 7500F FEG HRSEM

• FEI Quanta FEG ESEM

Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
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Instrument Rates
   

 

FEI 600 Quanta FEG ESEM
 
Applications
 
 
Secondary Electron Imaging
Backscattered Electron Imaging
Scanning-Transmission Electron Imaging
Wet Scanning-Transmission Electron Imaging
Environmental Mode Imaging of Non-Conducting Specimens

Qualitative and Quantitative Compositional Analysis
Compositional Mapping

Heating Experiments (up to 1000oC)
Cooling Experiments (down to -20oC)
Introduction of Aqueous/Solvent Vapor to Samples

Manipulation of Specimens with Nanomanipulators
Micro-Droplet Delivery via Nanomanipulator
Nanoscale Electrical Measurements

Also:

Wide Array of Additional Experiments Given the Unique

Array of Options for this Microscope

 

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering