Penn Regional Nanotechnology Facility

	General Information

	Electron Microscopy
	• JEOL 2010F FEG HRTEM/STEM • JEOL 2010 TEM • JEOL 7500F FEG HRSEM • FEI Quanta FEG ESEM

	Focused Ion Beam

	Atomic Force Microscopy

	Ion Scattering

	Applications

	Reservations

	Instrument Rates

	PRNF Registration Form

JEOL 2010 TEM

The JEOL 2010 TEM is available for both conventional and high resolution TEM imaging. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments. The analytical objective lens pole piece on this microscope allows for sample tilting up to 45 degrees, yet maintains a point-to-point resolution of 0.25 nm. In addition to the conventional plate camera, this instrument is equipped with a Gatan Peltier cooled CCD imaging system for high quality digital imaging.

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718