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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
 

• JEOL 2010F FEG
   HRTEM/STEM


• JEOL 2100 TEM

• JEOL 7500F FEG HRSEM

• FEI Quanta FEG ESEM

Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
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Instrument Rates
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NCF Registration Form
   

 

JEOL 2100 TEM
 
The JEOL 2100 TEM is available for both conventional and high resolution TEM imaging. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments. The analytical objective lens pole piece on this microscope allows for sample tilting up to 33 degrees, yet maintains a point-to-point resolution of 0.23 nm. This instrument is equipped with a GatanOrius CCD imaging system for high quality digital imaging and digital streaming video capture..
JEOL 2100 TEM

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering