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Penn Regional Nanotechnology Facility Penn Engineering
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General Information
Electron Microscopy
 

• JEOL 2010F FEG
   HRTEM/STEM


• JEOL 2010 TEM

• JEOL 7500F FEG HRSEM

• FEI Quanta FEG ESEM

Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
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Instrument Rates
   

 

JEOL 2010 TEM
 
Specifications
 
Resolution    
  Point-to-point Resolution 0.25 nm
  Information pass limit 0.14 nm
     
Gun    
  Filament Tungsten
  Accelerating voltage 80 - 200kV
  Minimum beam diameter 20 nm (TEM), 1 nm (NBD)
     
Imaging    
  Magnification range 2,000 - 1,500,000 x
  Low magnification range 50 - 6,000 x
  Image Recording Systems Film
    Gatan 694 1K CCD
     
Objective Lens    
  Pole piece Analytical
  Focal length 2.7 mm
  Spherical aberration coefficient

1.4 mm

  Chromatic aberration coefficient 1.8 mm
  Specimen tilt range +/- 45o
     
Specimen Holders

 

 
  Single tilt  
  Double tilt  
  Gatan heating holder 25 - 1000C
 

Gatan cooling holder

-175 - 50C

 

PENN Regional Nanotechnology Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering