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Nanoscale Characterization Facility Penn Engineering
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General Information
Electron Microscopy
 

• JEOL 2010F FEG
   HRTEM/STEM


• JEOL 2100 TEM

• JEOL 7500F FEG HRSEM

• FEI Quanta FEG ESEM

Focused Ion Beam
Atomic Force Microscopy
Ion Scattering
Applications
Reservations
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Instrument Rates
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NCF Registration Form
   

 

JEOL 2010F FEG HRTEM
The JEOL 2010F TEM/STEM is a state-of-the-art field emission transmission electron microscope with capabilities ranging from nanobeam and convergent beam diffraction to high resolution phase contrast, analytical and energy filtered imaging. The 2010F has been optimized for analytical microscopy with a large solid angle for high X-ray throughput, scanning, scanning-transmission, and backscattered electron detectors and a Gatan image filter for energy filtered imaging and electron energy loss spectroscopy. This combination of analytical capabilities makes the 2010F an ideal instrument for the characterization of a wide array of samples, yet the 2010F is also a very capable high-resolution instrument with a point-to-point resolution of 0.23 nm.

 

Nanoscale Characterization Facility
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
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  Penn Engineering