Applications

Transmission Electron Microscopy:

	Conventional TEM
	Dark-field TEM
	High-resolution, parallel-beam TEM
	EDS fine probe analysis
	Selected-area electron diffraction
	Nanobeam diffraction
	Convergent beam diffraction
	Double tilt holder for electron diffraction experiments
	in Situ heating holder (25 - 1000C)
	in Situ cooling holder (-175 - 50C)

Scanning Transmission Electron Microscopy:

	Conventional STEM
	High-resolution STEM
	High-angle annular dark-field STEM
	Secondary electron imaging
	Backscattered electron imaging

Energy Dispersive Spectroscopy:

	Automated spot analysis
	X-ray mapping
	Position tagged spectroscopy
	Image Analysis

Gatan Image Filter:

	Electron energy loss spectroscopy
	Zero-loss imaging
	Energy filtered imaging