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General Information |
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Electron Microscopy |
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Focused Ion Beam |
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Atomic Force Microscopy |
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Ion Scattering |
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Applications |
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Reservations |
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Instrument Rates |
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PRNF Registration Form |
FEI Strata DB235 Focused Ion Beam |
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| The FEI Strata DB235 Focused Ion Beam bridges the gap between nanocharacterization and nanomachining by combining a high resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling and ion-beam assisted material depostion and selective etching. Four gas injection systems will allow for platinum deposition and selective etching of carbon, metals, and oxides. |
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
