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General Information |
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Electron Microscopy |
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Focused Ion Beam |
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Atomic Force Microscopy |
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Ion Scattering |
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Applications |
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Reservations |
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Instrument Rates |
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FEI Strata DB235 Focused Ion Beam |
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Applications |
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Secondary electron imaging
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Low kV secondary electron imaging
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Backscattered electron imaging
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Image Analysis
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Computer assisted ion milling
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Targeted TEM section milling and mounting
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Pt deposition
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Selective carbon etching
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Selective metals etching |
Selective oxides etching |
University of Pennsylvania / 3231 Walnut Street / Philadelphia PA 19104 / prnf@seas.upenn.edu / 215.898.8718
