Variable Temperature Scanning Probe Microscope (VT-AFM/STM)

This unique ultra high vacuum (UHV) surface analysis system, consisting of two interlocked chambers: surface preparation/analysis and scanning probe chamber, allows for multiple surface processing and characterizations. Sample/tip can be prepared by annealing and ion sputtering in analysis chamber, and characterized with low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). In scanning probe chamber, surface imaging at the atomic level can be achieved with variable temperature scanning tunneling microscope/atomic force microscope (VT-STM/AFM), at the temperature range of 25-1500K. In addition, a home-built scanning surface potential microscope (SSPM) allows for imaging topography and potential maps of sample surface at the same time. Other techniques includes a complete gas inlet system for dosing varieties of small molecules, such as CO2, CH3OH and H2O, and mass spectrometer.

Omicron variable temperature scanning probe microscope instrument

Omicron variable temperature scanning probe microscope instrument

Topographic image of single-unit-cell-high steps on BaTiO3 (001) by STM

Topographic image of single-unit-cell-high steps on BaTiO3 (001) by STM

Atomic resolved STM image of (r5xr5) R26.6o and (3x1) super-structures on BaTiO3 (001) and LEED pattern

Atomic resolved STM image of (r5xr5) R26.6o and (3x1) super-structures on BaTiO3 (001) and LEED pattern

Stripe-ordering structure on BaTiO3 (001) by NC-AFM

Stripe-ordering structure on BaTiO3 (001) by NC-AFM

Surface potentials of artificial domains on ferroelectric PZT thin film

Surface potentials of artificial domains on ferroelectric PZT thin film