New Proximal Probe Techniques (design and theory) Publications

  1. Pushing Resolution Limits of Functional Imaging to Probe Atomic Scale Properties
    D. Bonnell ACS Nano 2 (2008) 1753–1759
  2. Probing Physical Properties at the Nanoscale
    M. J. Brukman, D. A. Bonnell Physics Today 61 (2008) 36-42
  3. Scanning Probe Microscopy of Oxide Surfaces: Atomic Structure and Properties
    D. A. Bonnell, J. Garra Reports on Progress in Physics 71 (2008) 044501
  4. High-Resolution Characterization of Defects in Oxide Thin Films,
    M. P. Nikiforov, M. J. Brukman, D. A. Bonnell Applied Physics Letters 93 (2008) 182101
  5. Scanning Probes of Nonlinear Properties in Complex Materials
    R. Shao and D.A. Bonnell Japanese J. of Appl. Phys. 43 (2004) 4471-4476
  6. Local Impedance Imaging and Spectroscopy of Local Transport in ZnO by contact AFM
    R. Shao, S. Kalinin, D. A. Bonnell   Appl. Phys. Lett. 82  (2003) 1869-1871.
  7. NanoImpedance Spectroscopy of Electrically Active Interfaces
    R. Shao, D. Bonnell  Proc. of the Materials Research Society Symposium, 738  (2003)  163-68
  8. PFM of Gallium Nitride
    Guy, Z, Zheng, K. Butcher, R. Shao, D. Bonnell  Proc. of the Materials Research Society Symposium (2004)
  9. Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy.
    R. Shao, S. Kalinin, D. Bonnell, Applied Physics Letters 82 (2003) 1869-1871.
  10. Carbon Nanotubes as a Tip Calibration Standard in Electrostatic Scanning Probe Microscopies.
    S. Kalinin, M. Freitag, A.T. Johnson, D. Bonnell, Appl. Phys. Lett. 81 (2002) 754-756.
  11. Contrast Mechanism Maps for Piezoresponse Force Microscopy.
    S. Kalinin, D. Bonnell J. Mat. Res. 17 (2002) 936-939.
  12. Imaging mechanism of Piezoresponse Force Microscopy of Ferroelectric Surfaces.
    Sergei V. Kalinin, Dawn A. Bonnell, Physical Review B 65 (2002) 125408.
  13. Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images.
    Sergei V. Kalinin, Dawn A. Bonnell, Microscopy Today, 2 (2002) 22.  
  14. Scanning Impedance Microscopy of an active Schottky barrier diode.
    Sergei V. Kalinin, Dawn A. Bonnell, J. Appl. Phys., (2002), 91(2), 832-839
  15. Scanning impedance microscopy of electroactive interfaces.
    Sergei V. Kalinin, Dawn A. Bonnell, Appl. Phys. Lett.  (2001),  78(9),  1306-1308.
  16. Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction.
    Tony Alvarez, Sergei V. Kalinin, Dawn A. Bonnell, Appl. Phys. Lett.  (2001),  78(7),  1005-1007.
  17. Analysis of phase distributions in the Li2O-Nb2O5-TiO2 system by piezoresponse imaging.
    Borisevich, Albina Y.; Kalinin, Sergei V.; Bonnell, Dawn A.; Davies, Peter K.  J. Mater. Res.  (2001),  16(2),  329-332.
  18. Scanning tunneling microscope combined with scanning electron microscope for the study of grain boundaries.
    Thibado, Paul M.; Liang, Yong; Bonnell, Dawn A. Rev. Sci. Instrum.  (1994),  65(10),  3199-203.
  19. Photoinduced scanning tunneling microscopy of insulating diamond films.
    Mercer, T. W.; Carroll, D. L.; Liang, Y.; DiNardo, N. J.; Bonnell, D. A.. J. Appl. Phys.  (1994),  75(12),  8225-7.
  20. Surface morphology of diamond thin films using photo-induced scanning tunneling microscopy.
    Carroll, D. L.; Mercer, T.; Liang, Y.; DiNardo, N. J.; Bonnell, D. A..  Mater. Res. Soc. Symp. Proc.  (1994),  332(Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy),  483-7.
  21. Tunneling Spectroscopic Analysis of Optically Active Wide Bandgap Semiconductors,
    D. A. Bonnell, G. S. Rohrer, R. H. French J. Vac. Sci. Technol. B  (1991),  9(2, Pt. 2),  551-6.
  22. Detection of Optically Excited States in Wide Band Gap Semiconductors with STM.G. S. Rohrer, D. A. Bonnell, R. H. French, J. Am. Ceram. Soc.  (1990),  73(11),  3257-63.