Publications on other topics

  1. Initial events at the bioactive glass surface in contact with protein-containing solutions.
    Kaufmann, E. A. B. Effah; Ducheyne, P.; Radin, S.; Bonnell, D. A.; Composto, R. J. Biomed. Mater. Res. (2000), 52(4), 825-830.

  2. Serum proteins affect the surface reaction layer on bioactive glass. Kaufmann, E. A. B. Effah; Ducheyne, P.; Radin, S.; Bonnell, D. A.; Composto, R.Bioceram., Proc. Int. Symp. Ceram. Med. (1999), 12 379-382.

  3. Atomic force microscopy of mechanically rubbed and optically buffed polyimide films.
    Brown, K. R.; Bonnell, D. A Liq. Cryst. (1998), 25(5), 597-601.

  4. Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films. Mercer, T. W.; Carroll, D. L.; Liang, Yong; Bonnell, D.; Friedmann, T. A.; Siegal, M. P.; Dinardo, N. J. Editor(s): Cohen, Samuel H.; Lightbody, Marcia L. At. Force Microsc./Scanning Tunneling Microsc. 2, [Proc. U.S. Army Soldier Syst. Command, Natick Res., Dev. Eng. Cent. Symp.], 2nd (1997), Meeting Date 1994, 53-58. Publisher: Plenum, New York, N. Y

  5. Nanostructuring of laser-deposited Ti films by self-limited oxidation.Gorbunov, Andre A.; Pompe, Wolfgang; Eichler, Horst; Huey, Bryan; Bonnell, Dawn A. J. Am. Ceram. Soc. (1997), 80(7), 1663-1667.

  6. Self-limitation of the laser-induced thermochemical reactions in ultrathin films. Gorbunov, A.A.; Eichler, H.; Pompe, W.; Huey, B.; Bonnell, D.A.; Akhsakhalyan, A.D. Proc. SPIE-Int. Soc. Opt. Eng. (1997), 3093(Nonresonant Laser-Matter Interaction (NLMI-9)), 127-136.

  7. Laser induced nanofabrication on titanium thin films. Huey, B. D.; Bonnell, D. A. Mater. Res. Soc. Symp. Proc. (1996), 397(Advanced Laser Processing of Materials--Fundamentals and Applications), 625-630.

  8. Investigation of initial oxide growth on NiAl by scanning tunneling microscopy.Wolf, B.; Warner, C.; Bonnell, D.; Bobeth, M.; Baunack, S.; Pompe, W. Dresden, Germany. Phys. Status Solidi A (1994), 145(2), 319-31.

  9. Investigation of initial oxide growth on NiAl by scanning tunneling microscopy. Wolf, B.; Bobeth, M.; Pompe, W.; Warner, C.; Bonnell, D.; Baunack, S. Editor(s): Hecht, G.; Richter, F.; Hahn, J. Thin Films, Proc. Jt. 4th Int. Symp. Trends New Appl. Thin Films 11th Conf. High Vac., Interfaces Thin Films (1993), 415-18. Publisher: DGM Informationsges., Oberursel, Germany

  10. Characterizing the microstructures of titanium nitride/titanium boride (TiN/TiB2) nanocomposites with energy filtered TEM.
    Szabo, V.; Ruehle, M.; Su, K.; Sneddon, L. G.; Bonnell, D. Mater. Res. Soc. Symp. Proc. (1993), 286(Nanophase and Nanocomposite Materials), 443-8.

  11. Synthesis, processing and phase evolution of titanium nitride/titanium boride (TiN/TiB2) composites from polymeric precursors.
    Nowakowski, M.; Su, K.; Sneddon, L.; Bonnell, D. Mater. Res. Soc. Symp. Proc. (1993), 286(Nanophase and Nanocomposite Materials), 425-30.

  12. Polymer precursor route to titanium diboride (TiB2)/titanium nitride (TiN) nanocomposites.
    Su, Kai; Nowakowski, Marilyn; Bonnell, Dawn; Sneddon, Larry G. Chem. Mater. (1992), 4(6), 1139-41.

  13. Structure of grain boundary phases in silicon nitride. Bonnell, Dawn A. Mater. Sci. Forum (1989), 47(Prep. Prop. Silicon Nitride Based Mater.), 132-42.

  14. Materials Science Forum, Vol. 47: Preparation and Properties of Silicon Nitride Based Materials.
    Bonnell, Dawn A.; Tien, T. Y.; Editors. Switz. (1989),307 pp. Publisher: (Trans Tech Publications, Zurich, Switz.)

  15. Spatially localized electronic structure in polyaniline by scanning tunneling spectroscopy.
    Bonnell, Dawn A.; Angelopoulos, Marie. Synth. Met. (1989), 33(3), 301-10.

  16. Development of structure in silicon nitride grain boundaries Bonnell, Dawn. Mater. Sci. Res. (1987), 21(Ceram. Microstruct. '86), 877-82.

  17. Controlled crystallization of the amorphous phase in silicon nitride ceramics. Bonnell, Dawn A.; Tien, Tseng Ying; Ruhle, Manfred. J. Am. Ceram. Soc. (1987), 70(7), 460-5.

  18. Uncertainty analysis for low P:B XEDS measurements - variation of aluminum in silicon nitride.
    Bonnell, D.; Bischoff, E. Ultramicroscopy (1987), 22(1-4), 191-6.

  19. High temperature properties of ceramics in the SiAlON system. Bonnell, D. A.; Tien, T. Y.; Lee, M.; Brun, M. K. Inst. Phys. Conf. Ser. (1986), 75(Sci. Hard Mater.), 401-12.

  20. Redistribution of aluminum ions during processing of Sialon ceramics. Bonnell, D. A.; Ruehle, M.; Tien, T. Y. J. Am. Ceram. Soc. (1986), 69(8), 623-7.