The Dawn A. Bonnell Research Group // Scanning Probe Techniques / Advanced non-contact AFM techniques

Advanced non-contact AFM techniques

Advanced noncontact AFM techniques

Kelvin probe + 2nd harmonic instrumentation

Omicron + Nanonis Instrumentation

Omicron VT AFM/STM. Ultra-high vacuum chamber with 4-1,000 K temperature range
Native Omicron Scala electronics control stm and contact afm.
Nanonis OC4 oscillator and RT4 real-time controller drive cantilever in nc-afm and demodulate deflection signal to control amplitude, frequency, determine Δf.
Built-in lock-ins and PID controller control dc tip bias for SKPM.
External srs lock-in calculates 2^nd harmonic amplitude.