Publications:
Characterization of Microscale Wear in a Polysilicon-Based MEMS Device using AFM and PEEM-NEXAFS Spectromicroscopy.
D.S. Grierson, A.R. Konicek, G.E. Wabiszewski, A.V. Sumant, M.P. de Boer, A.D. Corwin, R.W. Carpick. Tribol. Lett., (2009).
Environmental Performance Limits of Ultrananocrystalline Diamond Films
M.A. Hamilton, A.R. Konicek, A.V. Sumant, D.S. Grierson, O. Auciello, W.G. Sawyer, R.W. Carpick. STLE/ASME Int. Joint Tribol. Conf. Proc., IJTC 2008, Miami, FL, Oct. 2008.
Origin of ultralow friction and wear in ultrananocrystalline diamond
A.R. Konicek, D.S. Grierson, P.U.P.A. Gilbert, W.G. Sawyer, A.V. Sumant, R.W. Carpick. Phys. Rev. Lett., 100, 235502/1-4 (2008).
Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth
Y.C. Chen, X.Y. Zhong, A.R. Konicek, D.S. Grierson, N.H. Tai, I.N. Lin, B. Kabius, J.M. Hiller, A.V. Sumant, R.W. Carpick, O. Auciello. App. Phys. Lett., 92, 133113/1-3 (2008).
Tribochemistry and material transfer for the ultrananocrystalline diamond-silicon nitride interface revealed by x-ray photoelectron emission spectromicroscopy
D.S. Grierson, A.V. Sumant, A.R. Konicek, M. Abrecht, J. Birrell, O. Auciello, J.A. Carlisle, T.W. Scharf, M.T. Dugger, P.U.P.A. Gilbert, and R.W. Carpick. J. Vac. Sci. Technol. B, 25, 1700-5 (2007).
Surface composition, bonding, and morphology in the nucleation and growth of ultra-thin, high quality nanocrystalline diamond films
A.V. Sumant, P.U.P.A. Gilbert, D.S. Grierson, A.R. Konicek, M. Abrecht, J.E. Butler, T. Feygelson, S.S. Rotter, R.W. Carpick, Diam. Rel. Mat., 16, 718-24 (2007).
Electron-phonon interaction at the Si(111)-7×7 surface
I. Barke, F. Zheng, A.R. Konicek, R.C. Hatch, F.J. Himpsel. Phys. Rev. Lett., 96, 216801/1-4 (2006).
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