Jingjing Liu

Phone Number: 608-262-3405
Email: jliu27_at_wisc.edu
Office: 2020 Mechanical Engineering

Education:

Ph.D. Candidate, Materials Science, (expected 2010), U. Wisconsin-Madison
M.S., Applied Physics, (2006), U. New Orleans
M.S., Materials Science and Engineering, (2005), Southwest Jiaotong University
B.S., Materials Science and Engineering, (2002), Southwest Jiaotong University

Research Interests:

Atomic force microscopy (AFM) is used in a range of applications, including the study of nanoscale tribology, industrial metrology, nanolithrography, probe-based information storage, and manipulation of biomolecules. Tip integrity and tip degradation are the key issues that govern the accuracy and reliability of all AFM applications. My work involves characterizing and understanding tip degradation at the nanoscale, as well as developing wear-resistant AFM probes from carbon-based materials, including ultrananocrystalline diamond (UNCD) and diamond-like carbon (DLC). I also use transmission electron microscopy (TEM) to measure changes of the AFM tips at the nanoscale.

Publications:

Room-temperature Ferromagnetism of Mn-doped ZnO Aligned Nanowire Arrays with Temperature Dependent Growth
J. Liu, K. Wang, M. Yu, W. Zhou. J. Appl. Phys., 024301 (2007).

Fabrication of Mn doped ZnO Diluted Magnetic Semiconductors Nanostructures by Chemical Vapor Deposition
J. Liu, M. Yu, W. Zhou. J. Appl. Phys., 99, 08M119 (2006).

Well-aligned Mn-doped ZnO nanowires synthesized by a chemical vapor deposition method
J. Liu, M. Yu, W. Zhou. Appl. Phys. Lett., 87, 172505 (2005).

Preparation and Characterization of Tin Doped Tetra-pod Shaped Zinc Oxide
J. Liu, Z. Zhou, K. Wang, Y. Li. Mater. Sci. Forum, 486-487, 1161 (2005).

Awards:

3^rd place poster award, Spring 2005, 5^th Louisiana Conference on Advanced Materials & Emerging Technologies (LaCOMET)
Excellent Master Thesis, Spring 2005, Southwest Jiaotong University