|
|
Tevis Jacobs |
|
Education:
M.S., (2006), Stanford University
MPhil, (2004), Churchill College, Cambridge
B.S., (2003), U. Pennsylvania
|
Research Interests:
I am interested in the fundamental origins and behavior of atomic-scale adhesion, friction, and wear. Initial projects include the characterization of carbon-based scanning probe tips and their evolution with wear testing. Techniques used include atomic force microscopy and transmission electron microscopy. Future projects will include in-situ imaging of nanotribological phenomena. |
|
|