- State of
the art facilities are available for the synthesis, structure
characterization, compositional analysis, and property measurement of
electronic ceramic systems.
Penn Regional Nanotechnology Facility houses an
electron microscopy laboratory with three TEM's, including a
JEOL2010FEG microscope equipped with an EDS x-ray spectrometer and
parallel EELS system with a Gatan image filter. This microscope
it capable of producing 2.3 A point-to point imaging resolution and the
STEM can yield chemical analysis with 1-2nm resolution. We also
have a JEOL 4000EX high resolution microscope capable of collecting
images with 1.9A resolution. The facility also contains 2 SEM's
for surface morphology and quantitative analytical
characterization. The facility also contains a FEI Strata
DB235 Focused Ion Beam that bridges the gap between
nanocharacterization and nanomachining by combining a high resolution
field-emission scanning electron microscope with a focused ion beam.
Uniting these techniques in a single instrument allows users to
seamlessly switch from secondary electron imaging to precision ion
milling and ion-beam assisted material depostion and selective etching.
Four gas injection systems allow for platinum deposition and selective
etching of carbon, metals, and oxides. Both AFM and STM systems
are available for detailed studies of surface topology and electronic
properties and the ion scattering facility contains an RBS system
for quantitative compositional analysis of bulk and thin film systems.
- The MSE
department has x-ray powder
diffractometers and associated software for the simulation and
refinement of powder patterns and for crystal structure
visualization. The MRSEC Program at Penn (LRSM) is also affiliated
with synchrotron and neutron lines at major National Laboratory
laboratory contains furnaces capable for preparing ceramic materials at
temperatures up to 17000C under a variety of atmospheres.
for characterization of material properties includes an LCR system for
dielectric measurements from 100Hz to 1MHz at temperatures from liquid
nitrogen to 2000C. A Radiant Ferroelectric testing
system for polarization-field measurements. A network analyzer
for loss measurements of microwave materials up to 20GHz using
resonant cavity techniques. We also share the use of a PPMS
(Physical Properties Measurement System) that can measure resistance,
AC susceptibility and DC magnetization down to liquid helium
temperatures and up to fields of 9 Tesla.