Equipment

  • Atomic Force Microscope (DI, model 3100)
  • Automatic Polishing System (Struers, Rotosystem-250)
  • Cold Isostatic Press (ABB, CIP)
  • Cryostat (APD Cryogenics, DISPLEX DE-202)
  • Elevated Pressure Furnace (Centorr Vacuum, EP-10)
  • Eximer Laser (Lambda Physik)
  • Ferroelectric Test System (Radiant Technology, RT66A)
  • Floor-standing Testing System (MTS 810)
  • Graphite Hot Zone Furnace (Thermal Technology, LABMASTER 1000A)
  • Heated Press (Carver M)
  • Hot Press (Thermal Technology, Laboratory Hot Press 1400)
  • In-situ R-curve Measurement System
  • Inverted Research Metallurgical Microscope (Olympus, PMG3)
  • Impedance Analyzer (HP, 4192A)
  • Low Speed Saw (Buehler, Isomet)
  • Mercury Intrusion Porosimeter (Quantachrome, PoreMaster 60)
  • Mixermill (SPEX Certiprep, 8000M)
  • Multi-Cathode DC/RF Magnetron Sputter System (Denton Vacuum, Discovery┬« 24)
  • Optical Microscope (Leica, DM-LM)
  • Particle Size and Zeta Potential Analyzer (Malvern, Zetasizer 3000Hs)
  • Physical Properties Measurement System (Quantum Design)
  • Probe Station (Signatone, S1160)
  • Pulse Laser Deposition System (Neocera)
  • Spincoater (CEE 100)
  • Surface Area and Pore Size Analyzer (Quantachrome, Nova 2000)
  • Surface Grinder (Bridgeport, HARIG 618 EZ-SURF)
  • System Microscope (Olympus, BHS-BHT)
  • Ultracentrifuge (Beckman Coulter, Optima L-90K)
  • Ultrasonic Cell Disrupter (Virtis, Virsonic 475)
  • UV/Vis Spectrophotometer (Beckman Coulter, DU┬« Series 600)
  • Vacuum or Controlled Atmosphere Front Access Furnace (Materials Research Furnaces)
  • Vickers Hardness Tester (Shimadzu, HSV-20)