Reflectance Measurement

Updated on 1/5/2015

 

Acquisition of Intensity Reflectance Data

1. Use the 'Change angle of incidence' option to move the angle of incidence to whatever the lowest angle of incidence that you wish to acquire reflectance data is. For example, if you are going to acquire reflectance data at 60, 65, and 70 degree angle of incidence, move the angle of incidence to 60 degree.

2. Set the sample stage and detector arm to the straight through configuration.

3. Mount the alignment detector and open the detector iris all of the way.

4. Turn the room lights out and reduce the ambient lighting as much as possible.

5. Select 'R&T data' from the Acquire data menu from the hardware window.

6. Select the appropriate wavelength range and range of angles of incidence in the dialogue box which appears. You will also need to specify the polarization of input beam, either by selecting p- or s-polarized reflectance or by specifying a polarizer angle.

7. Click "OK".

8. The VASE will acquire the background scan. When done, you will be prompted to return the sample and detector goniometers to the original position (which should be the first angle of incidence of your scan).

9. Mount the sample, and translate the sample stage along the sample normal to center the reflected beam on the detector. You will need to close the detector iris in order to do this. When centered, open the detector iris all of the way and hit "OK".

10. The VASE will acquire the reflectance data at each specified angle of incidence. When the acquisition is finished, you will be prompted to save the data.